Foto: Oliver Birli | TU Ilmenau
MetroShift - Measurement Technology Consulting
We have experience from 25 years of practical top-level research and production in the university context in 3D positioning and coordinate metrology, topography and distance measurement as well as in derived metrological areas.



![Nanopositioning and Nanomeasuring Machine<br/> [NPMM-200]](/images/metroshift/portfolio/_DSF5430-002.jpg)
![Interferometric Nano Profiler <br /> [INP]](/images/metroshift/portfolio/DSCF6250-002.jpg)

![Marker design [IND 10]](/images/metroshift/portfolio/Marker_on_lens.jpg)

